Customization: | Available |
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Function: | Storage |
Display: | Digital |
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Test item | Type | Test current | Initial State | Limit of tripping or non-tripping | Expected Result |
a | B,C,D | 1.31In | Cold State | t≥1h (In≤63A) t≥2h (In>63A) |
Not tripping |
b | B,C,D | 1.45In | Following with test of item a | t<1h (In≤63A) t<2h (In>63A) |
Tripping |
c | B,C,D | 2.55In | Cold State | t<1h (In≤63A) t<2h (In>63A) |
Not tripping |
d | B,C,D | 3In, 5In, 10In | Cold State | 1s<t<60s (In≤63A) 1s<t<120s (In>63A) |
Tripping |
e | B,C,D | 5In, 10In, 50In | Cold State | T<0.1s |